Coating Thickness Measurement Gauge For Connectors XDLM 237

Coating thickness measurement gauge XDLM237 is engineered from the best available methods as per the national and international industrial standards. The range is available for measuring manual or automated coating thickness and analysis on electronics components, PC-boards and mass-produced parts even on small parts. Our Coating Measurement Gauge is used for the measurement and study of thin coatings.

Models

Applications

• Measurement of electroplated mass-produced parts
• Inspection of thin coatings like decorative chromium-plating
• Analysis of functional coatings in the electronics and semiconductor industries
• Automated measurements like on printed circuit boards

General Specification

• Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and alloys.
• Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously.
• Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable
• Motor-driven changeable apertures and filters
• Video camera and laser pointer (class 1) for orienting the sample
• Measuring direction:Top down

X-Ray Source

X-ray tube:Micro focus tungsten tube with beryllium window

High voltage:Three steps 10 kV, 30 kV, 50 kV

Aperture (Collimator):4x changeable:  0.1 mm (3.9 mils),  0.3 mm (11.8 mils),  0.6 mm (23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request

Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot: As per the measuring distance and aperture, the actual measurement spot size is displayed in the video image. Smallest measurement approx.  0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)

X-Ray Detection

X-ray detector:Silicon PIN detector with peltier cooling

Resolution (fwhm for Mn-K±): 200 eV

Measurement distance:0-80 mm (0-3.2 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Sample Alignment

Video microscope:High-resolution CCD color camera is available for optical monitoring of the measurement site along the primary beam axis, auto-focus, manual focusing, crosshairs with a calibrated scale (ruler) as well as spot- indicator, laser pointer (class 1) and adjustable LED illumination to support accurate sample placement.

Zoom factor:Digital 1x, 2x, 3x, 4x

Sample Stage

• Design: Programmable, motor-driven XY-stage
• Maximum travel: X/Y-axis: 255 x 235 mm (10 x 9 in); Z-axis: 140 mm (5 in)
• Max. travel speed: 80 mm/s (3.2 in/s)
• Repeatability precision XY:  0.01 mm (0.4 mils), unidirectional
• Usable sample Width x depth [mm]: 300 x 350 mm, [in]: 12 x 14 placement area:
• Max. sample weight: 5 kg, with reduced approach travel precision 20 kg
• Max. sample height: 140 mm (5.5 in)

Electrical Data

• Power supply:AC 115 V or AC 230 V 50 / 60 Hz
• Power consumption:Max. 120 W without evaluation PC
• Protection class:IP40

Dimensions

External dimensions

• Width x depth x height [mm]:570 x 760 x 650 mm, [in]: 22 x 30 x 26
• Interior dimensions460 x 495 x 146 mm, [in]: 18 x 19.5 x 5.7
• Width x depth x height [mm]: measurement chamber
• Weight:Approx. 115 kg (52 lb)

Environmental Conditions

• Temperature: Operation:10^oC - 40^oC / 50^oF- 104^oF
• Temperature: ^oC- 50^oC / 32^oF - 122^oF
• Storage/Transport:
• Admissible air humidity: 95 %, non-condensing
• Evaluation Unit
• Computer:Windows ®-PC
• Software:Standard: Fischer WinFTM ® BASIC including PDM®,
• Optional: Fischer WinFTM® SUPER

Standards

• CE approval:EN 61010
• X-Ray standards:DIN ISO 3497 and ASTM B 568
• Approval:Fully protected instrument with type approval according to the German regulations.