Coating Thickness EDXRF(Energy Dispersive XRF)

The combination of state-of-the-art detector technology such as SDD, multiple excitations in various modes, and the powerful analysis software, WinFTM® , allows for reliable, accurate measurements of both coating thickness of electroplated materials and phosphorous content of electroless nickel coatings on a wide variety of substrate materials. The XRF machine unites all these performance features in one instrument.

X-Ray Fluorescence Measuring Instrument for Manual or Automated Coating Thickness Measurements on Protective and Decorative Coatings, Mass-Produced Parts and Printed Circuit Boards

FISCHER offers measurement devices that are specially adapted to the measurement of the thinnest surface coatings on assembled and non-assembled PCBs. We also offer special measurement technology for multilayer circuit boards and flex PCBs

Determination of the thickness of typical contact coatings such as Au/Ni/Base, SnPb/Ag/Ni/Base, Au/PdNi/Ni/Base etc with XRF instruments.

Measurement of the coating thickness of hard material coatings such as TiN, TiCN, CrN or CrVN using the X-ray fluorescence (XRF) measuring instruments FISCHERSCOPE X-RAY XDAL and XDV-SDD along with Measurement of the coating thickness of thin coatings such as DLC coatings using the beta backscatter method in the FISCHERSCOPE® MMS® PC2

Determination of the coating thickness of tin, silver and zinc coatings on copper wires or copper coatings on iron wires with XRF instruments. X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for Measurements on Very Small Structures

Watch hands, faces, gear wheels and other visible elements inside high quality watches are often plated with gold or other precious metals that lend the watch its elegant look. Here, not only is the visual effect important but also the precise functioning of the parts. Tight tolerance limits require extremely precise coating thickness measurements, such as those achieved using X-ray fluorescence

Determination of Harmful Substances in Very Small Concentrations – RoHS screening using ED-XRF