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Lead Frame Coating Thickness Measurement XDV-U
Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.
Applications
- Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames
- Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils)
- Measurement of functional coatings in the semiconductor and electronics industries
- Determination of complex multi-coating systems
- Automated measurements like quality control
General Specification
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures.
Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously.
Design:Bench-top unit with hood opening upwards and housing with a slot on the side.
X/Y- and Z-axis electrically driven and programmable
Motor-driven changeable filters
Measuring direction:Top down
X-Ray Source/Detection
X-ray tube:Standard: Micro focus tube with tungsten target and beryllium window
Optional: Micro focus tube with molybdenum target and beryllium window
High voltage:Three steps: 10 kV, 30 kV, 50 kV
Primary filter:4x changeable: Ni 10 m (0.4 mils); free; Al 1000 m (40 mils); Al 500 m (20 mils)
X-ray optics:Polycapillary
X-Ray Source/Detection
- Standard Non halo-free
- Option 20m Halo-free
- Option 10m Non halo-free
- Measurement spot, fwhm at Mo-K±
- Appr. 20m (0.8 mils)
- Appr. 20m (0.8 mils)
- Appr. 10m (0.4 mils)
X-ray detector
- Peltier-cooled silicon-drift-detector (SDD)
- Peltier-cooled silicon-drift-detector (SDD)
- Peltier-cooled silicon-drift-detector (SDD)
Effective detector area
- 20 mm2 (0.03 in2)
- 50 mm2 (0.08 in2)
- 50 mm2 (0.08 in2)
For halo-free capillaries, the radiation intensity for energies of the x-radiation is concentrated on the small measurement spot. For capillaries, indicated as radiation, non halofree intensity with high energies (E > 20 keV) can cover a notably larger area than the nominal measurement spot.
Sample Alignment
Video Microscope: High-resolution CCD color camera for optical monitoring of the dimension location along the Crosshairs with a calibrated scale (ruler), primary beam axis, manual focusing and auto-focus, and spot-indicator, Adjustable LED illumination, Laser pointer (class 1) to support precise specimen placement.
Zoom factor:Up to 1080x (Optical: 30x, 90x, 270x; Digital: 1x, 2x, 3x, 4x)
X-Ray Detection
X-ray detector:Proportional counter tube
Absorber:XULM 240 only: optional cobalt or nickel absorber
Measuring distance:0 - 25 mm (0 - 1 in)
Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.
Evaluation Unit
- Computer:Windows®-PC
- Software:Standard: Fischer WinFTM® LIGHT
- Optional: Fischer WinFTM® BASIC, PDM®, SUPER
- Sample support stage
- Sample Stage
Standard
Option Supporting Plate PCB
Design
Speedy, programmable XY-stage with pop-out function
Quick, programmable XY-stage with pop-out function and large placement area for measurements on PCBs
Usable sample placement area
Width x depth: 370 mm x 320 mm (14.6 in x 12.6 in)
Width x depth: 620 mm x 530 mm (24.4 in x 20.9 in)
Usable maximum travel
X/Y-axis: 250 mm x 220 mm (9.8 in x 8.7 in) Z-axis: 140 mm (5.5 in)
X/Y-axis: 250 mm x 220 mm (9.8 in x 8.7 in) Z-axis: 140 mm (5.5 in)
Max. travel speed X/Y
60 mm/s (0.2 ft/s)
60 mm/s (0.2 ft/s)
Repeatability precision X/Y
unidirectional: 5 m (0.2 mils) max., 2 m (0.08 mils) typ.
unidirectional: 5 m (0.2 mils) max., 2 m (0.08 mils) typ.
Max. sample weight
5 kg (11 lb), with reduced precision max. 20 kg (44 lb)
5 kg (11 lb), with reduced precision max. 20 kg (44 lb)
Max. sample height
135 mm (5.3 in)
135 mm (5.3 in)
Electrical Data
- Power supply:AC 115 V or AC 230 V 50 / 60 Hz
- Power consumption:max. 120 W, without evaluation PC
- Protection class:IP40
Dimensions
External dimensions:Width x depth x height [mm]: 660 x 835 x 720 mm (26 x 33 x 28.3 in)
Weight:Approx. 135 kg (297 lb)
Interior dimensions of chamber: Width x depth x height: 580 x 560 x 145 mm (22.8 x 22 x 5.7 in)
Environmental Conditions
Operating temperature:10oC - 40oC / 50oF - 104oF
Storage/Transport temperature:0oC - 50oC / 32oF - 122oF
Admissible air humidity: 95 %, non-condensing
Standards
- CE approval: EN 61010
- X-Ray standards:DIN ISO 3497 and ASTM B 568
Approval:Fully protected instrument with type approval according to the German regulations
Product details
Dimension | 403 x 588 x 444 mm |
Testing Methodology | Radiographic Testing |
Brand | Fischer |
Service Type | Thickness Measurement |
Value Data Report on | Microstructure |
Application | Mechanical Engineering |