FISCHERSCOPE X-RAY XDV - U XDV-u

Applications

 

• General Specification
• Energy dispersivex-ray fluorescence measuring instrument (EDXRF) to measure thin coatings andcoating systems on very small flat structures 
• Aluminum Al (13) toUranium U (92)  up to 24 elements simultaneously.
• Bench-top unit withhood opening upwards and housing with a slot on the side.
• Measuring direction: Top down
• X-Ray Source/Detection
• Standard: Micro focustube with tungsten target and beryllium window
• Three steps: 10 kV, 30kV, 50 kV
• Primaryfilter:4x changeable: Ni 10m(0.4 mils); free; Al 1000m (40 mils); Al 500m (20 mils)