Thin Coating Thickness Measurement Instrument XDLM

Thin Coating Thickness Measurement Instrument for electroplating and electroless coatings is designed under the direction of knowledgeable quality controllers. The range of Thin Coating Thickness is designed for automated or manual coating thickness measurements and examination on PC-boards. They are energy dispersive X-ray fluorescence measuring instruments for the measurement and investigation of thin coatings, even at small concentrations. 

Models

Applications

General Specification

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys.

Element range:Chlorine (17) to Uranium (92) €“ up to 24 elements simultaneously with option WinFTM® BASIC.

Design:Bench top unit with upwards opening hood

Measuring direction:Top down

X-Ray Source

X-ray tube:Micro-focus tungsten tube with beryllium window

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):4x changeable

Standard (523-440):[mm]: ˜ 0.1, ˜ 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]:  3.9,˜ 7.9, 2 x 2, 7.9 x 1.2

Optional (523-366):[mm]: ˜ 0.1, ˜ 0.2, ˜ 0.3, 0.3 x 0.05; [mils]:  3.9,  7.9,  11.8, 11.8 x 2

Optional (524-061):[mm]:  0.1, ˜ 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: 3.9, ˜ 7.9, 11.8 x 2, 2 x 2

Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot: Depending on the measuring distance and on the aperture, the actual measurement. Spot size is shown in the video image.

Smallest measurement spot: approx.

˜ 0.1 mm (3.9 mils) with aperture

0.05 x 0.05 mm (2 x 2 mils)

X-Ray Detection

X-ray detector:Proportional counter tube

Measuring distance: 0-80 mm (0-3.2 in)

Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Sample Alignment

Sample positioning:Manually

Video microscope:High-resolution CCD colour camera for optical monitoring of the measurement location along the primary beam axis, manual focusing and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator, adjustable LED illumination,laser pointer (class 1) to support accurate sample placement.

Zoom factor:Digital 1x, 2x, 3x, 4x

Evaluation Unit

Computer:Windows®-PC

Software:Standard: Fischer WinFTM® LIGHT

Optional: Fischer WinFTM® BASIC, PDM®, SUPER

Sample support stage

Sample Stage
	XDLM 231	XDLM 232	XDLM 237
Design	Fixed sample Support	Manual XY-stage	Programmable XY-stage
Maximum travel XY	-	95 x 150 mm (3.7 x 5.9 in)	255 x 235 mm (10 x 9.2 in)
Travel speed XY	-	-	80 mm/s (3.1 in/s)
Repeatability precision XY	-	-	0,01 mm (0.4 mils)(*1)
Usable sample placement area	463 x 500 mm (18.2 x 19.7 in)	420 x 450 mm (16.5 x 17.7 in)	300 x 350 mm (11.8 x 13.8 in)
Z axis	Electrically adjustable	Electrically adjustable	Programmable
Travel Z axis	140 mm (5.5 in)	140 mm (5.5 in)	140 mm (5.5 in)
Max. sample weight	20 kg (44 lb)	20 kg (44 lb)	5 kg (11 lb) / 20 kg (44 lb)(*2)
Max. sample height	140 mm (5.5 in)	140 mm (5.5 in)	140 mm (5.5 in)

Electrical Data

Power supply:AC 115 V or AC 230 V 50 / 60 Hz

Power consumption:max. 120 W, without evaluation PC

Protection class:IP40

Dimensions

External dimensions:Width x depth x height [mm]: 570 x 760 x 650, [in]: 22 x 30 x 26

Interior dimensions: Width x depth x height [mm]: 460 x 495 x 146, [in]: 18 x 19.5 x 5.7

measurement chamber:

Weight:XDLM 231: 100 kg/220 lbs; XDLM 232: 108 kg/238 lbs;

XDLM 237: 120 kg/265 lbs

Environmental Conditions

Operating temperature:10^oC -“ 40^oC / 50^oF-€“ 104^oF

Storage/Transport: 0^oC-“ 50^oC / 32^oF -“ 122^oF

temperature:

Admissible air humidity:  95 %, non-condensing/p>

Standards

CE approval:EN 61010

X-Ray standards:DIN ISO 3497 and ASTM B 568

Approval:Fully protected instrument with type approval according to the German regulations