GOLDSCOPE SD 550 SD 550

• These are user-friendly devices acclaimed for compact size and consistent performance.
• Our devices are acclaimed for their quick and easy sample positioning and consistent performance.
• These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.
• Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensures clear presentation of measurement data on a PC with the help of powerful and user-friendly WinFTM® software.
• These are designed and developed in accordance with German regulations "Deutsche Rontgenverordnung-röv"
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Typical areas of application are:

Precious Metal Analysis such as analysis of Gold, Silver, Platinum and its alloys along with detection of PGM group elements such as Iridium, Ruthenium, Osmium, Rhenium, Tin and Lead.

• Measurement of functional coatings, starting from a few nanometers
• Analysis of alloys with highest requirements of accuracy in the jewelry and watch
• Industries and in metal refineries
• Research in universities and in the industries
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• Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys
• Element range:Aluminum (13) to Uranium (92), up to 24 elements simultaneously
  
• Design:Bench-top unit with hood opening upwards opening hood
• Measuring direction: Bottom-up

• X-ray tube: Micro focus tungsten tube with beryllium window
• High voltage: Three steps 10 kV, 30 kV, 50 kV
• Aperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0.6 mm (23.6 mils), Ø 1 mm (39.4 mils)
  , Ø 2 mm (78.7 mils), others on request.
• Primary filter: 6x changeable: Ni, free, Al 1000 μm (39.4 mils); Al 500 μm (19.7 mils);
  Al 100 μm (3.9 mils); Mylar® 100 μm (3.9mils).
• Measurement spot: Depending on the measuring distance and on the aperture, the actual measurement spot size is shown in the video image.Smallest measurement spot: approx. Ø 0.3 mm (11.8 mils)

• X-ray detector: Silicon Drift Detector (SDD), peltier-cooled
• Resolution (fwhm for Mn-Kα):≤ 160 eV
• Measurement distance: 0 … 25 mm (0 … 1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications, an additional calibration might be necessary.

• Sample positioning: Manually
• Video microscope: High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis, Crosshairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination.
• Zoom factor: Digital 1x, 2x, 3x, 4x
  
  

Electrical Data

• Power supply:AC 115 V or AC 230 V 50 / 60 Hz
• Power consumption: Max. 120 W , without evaluation PC
• Protection class: IP40

Environmental Conditions

• Temperature Operation:10 °C – 40 °C / 50 °F – 104 °F
• Temperature Storage/Transport: 0 °C – 50 °C / 32 °F – 122 °F
• Admissible air humidity:≤ 95 %, non-condensing

• Computer:Windows®-PC
• Software:Standard: Fischer WinFTM® BASIC including PDM®,
• Optional: Fischer WinFTM® SUPER
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